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Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances.

Jiann-Shiun YuanJ. MaWen-Kuan YehChia-Wei Hsu
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • dual band
  • high power
  • power consumption
  • narrow band
  • scale space
  • microstrip