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Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances.
Jiann-Shiun Yuan
J. Ma
Wen-Kuan Yeh
Chia-Wei Hsu
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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dual band
high power
power consumption
narrow band
scale space
microstrip