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Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs.

Wenqi ZhangTzuo-Li WangYan-hua HuangTsu-Ting ChengShih-Yao ChenYiying LiChun-Hsiang HsuChih-Jui LaiWen-Kuan YehYilin Yang
Published in: Microelectron. Reliab. (2016)
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