Walter Hansch

Publication Activity (10 Years)

Years Active: 2000-2019
Publications (10 Years): 2

Top Topics

Levels Of Abstraction

Evaluation Criteria

Genetic Algorithm

Top Venues

Microelectron. Reliab.

Publications

A. Hirler, A. Alsioufy, J. Biba, T. Lehndorff, D. Lipp, H. Lochner, Mahesh Siddabathula, S. Simon, T. Sulima, M. Wiatr, Walter Hansch
Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability. IRPS (2019)
A. Hirler, J. Biba, A. Alsioufy, T. Lehndorff, T. Sulima, H. Lochner, U. Abelein, Walter Hansch
Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability. Microelectron. Reliab. (2017)
Kirsten Hilsenbeck, Alexander Schömig, Walter Hansch
Zeitdiskrete Modellierung der Wechselwirkungen der Plan-Vorgaben bei Verwendung der Liefertreue als Leistungsgröße für die interne Supply Chain in der Halbleiterindustrie. OR (2004)
Thomas Nirschl, Peng-Fei Wang, Walter Hansch, Doris Schmitt-Landsiedel
The tunnelling field effect transistors (TFET): the temperature dependence, the simulation model, and its application. ISCAS (3) (2004)
G. Shrivastav, S. Mahapatra, V. Ramgopal Rao, J. Vasi, K. G. Anil, C. Fink, Walter Hansch, I. Eisele
erformance Optimization Of 60 Nm Channel Length Vertical Mosfets Using Channel Engineering. VLSI Design (2001)
A. Stadler, I. Genchev, A. Bergmaier, G. Dollinger, V. Petrova-Koch, Walter Hansch, H. Baumgärtner, I. Eisele
Nitrogen implantations for rapid thermal oxinitride layers. Microelectron. Reliab. 41 (7) (2001)
Masayasu Tanaka, N. Tokida, T. Okagaki, Mitiko Miura-Mattausch, Walter Hansch, Hans Jürgen Mattausch
High performance of short-channel MOSFETs due to an elevated central-channel doping. ASP-DAC (2000)