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Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability.
A. Hirler
J. Biba
A. Alsioufy
T. Lehndorff
T. Sulima
H. Lochner
U. Abelein
Walter Hansch
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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neural network
hidden markov models
genetic algorithm
decision trees
artificial neural networks
evaluation criteria
evaluation model
levels of abstraction