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Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability.

A. HirlerA. AlsioufyJ. BibaT. LehndorffD. LippH. LochnerMahesh SiddabathulaS. SimonT. SulimaM. WiatrWalter Hansch
Published in: IRPS (2019)
Keyphrases
  • high quality
  • database
  • databases
  • genetic algorithm
  • learning algorithm
  • first order logic