Tuami Lasri

Publication Activity (10 Years)

Years Active: 2006-2016
Publications (10 Years): 4

Top Topics

High Throughput

Fluorescence Microscopy

Multiresolution

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Tuami Lasri
Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform. IEEE Trans. Instrum. Meas. 65 (4) (2016)
Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Gilles Dambrine, Tuami Lasri
Measurement accuracy and repeatability in near-field scanning microwave microscopy. I2MTC (2015)
Kamel Haddadi, Tuami Lasri
Forward V-band vector network analyzer based on a modified six-port technique. WiSNet (2015)
Abdelhatif El Fellahi, Kamel Haddadi, Jaouad Marzouk, Steve Arscott, Christophe Boyaval, Tuami Lasri, Gilles Dambrine
On-wafer probe station for microwave metrology at the nanoscale. I2MTC (2015)
Kamel Haddadi, Tuami Lasri
Geometrical Optics-Based Model for Dielectric Constant and Loss Tangent Free-Space Measurement. IEEE Trans. Instrum. Meas. 63 (7) (2014)
Kamel Haddadi, Tuami Lasri
Six-port technology for millimeter-wave radar and imaging applications. WiSNet (2014)
Pietro M. Ferreira, Cora Donche, Kamel Haddadi, Tuami Lasri, Gilles Dambrine, Christophe Gaquière, Thomas Quemerais, Daniel Gloria
1-20 Ghz kΩ-range BiCMOS 55 nm reflectometer. NEWCAS (2014)
Hind Bakli, Kamel Haddadi, Tuami Lasri
Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications. IEEE Trans. Instrum. Meas. 63 (5) (2014)
Kamel Haddadi, Tuami Lasri
Scanning Microwave Near-Field Microscope Based on the Multiport Technology. IEEE Trans. Instrum. Meas. 62 (12) (2013)
Hind Bakli, Kamel Haddadi, Tuami Lasri
Interferometric technique for scanning near-field microwave microscopy applications. I2MTC (2013)
Etienne Herth, H. Desré, Emmanuelle Algré, Christiane Legrand, Tuami Lasri
Investigation of optical and chemical bond properties of hydrogenated amorphous silicon nitride for optoelectronics applications. Microelectron. Reliab. 52 (1) (2012)
Kamel Haddadi, M. M. Wang, David Glay, Tuami Lasri
Performance of a Compact Dual Six-Port Millimeter-Wave Network Analyzer. IEEE Trans. Instrum. Meas. 60 (9) (2011)
Etienne Herth, Bernard Legrand, Lionel Buchaillot, Nathalie Rolland, Tuami Lasri
: H films deposited by PECVD for reliability of electronic, microsystems and optical applications. Microelectron. Reliab. 50 (8) (2010)
O. Benzaim, Kamel Haddadi, M. M. Wang, M. Maazi, David Glay, Tuami Lasri
Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique. IEEE Trans. Instrum. Meas. 57 (11) (2008)
M. Maazi, O. Benzaim, David Glay, Tuami Lasri
Detection and Characterization of Buried Macroscopic Cracks Inside Dielectric Materials by Microwave Techniques and Artificial Neural Networks. IEEE Trans. Instrum. Meas. 57 (12) (2008)
Kamel Haddadi, Hassan El Aabbaoui, Christophe Loyez, David Glay, Nathalie Rolland, Tuami Lasri
Wide-band 0.9 GHz to 4 GHz Four-Port Receiver. ICECS (2006)
Kamel Haddadi, David Glay, Tuami Lasri
Homodyne dual six-port network analyzer and associated calibration technique for millimeter wave measurements. ISCAS (2006)