Interferometric technique for scanning near-field microwave microscopy applications.
Hind BakliKamel HaddadiTuami LasriPublished in: I2MTC (2013)
Keyphrases
- long range
- scan data
- image analysis
- image reconstruction
- fourier transform
- high throughput
- structured light
- synthetic aperture radar
- high resolution
- data sets
- image enhancement
- x ray
- frequency band
- synthetic aperture
- fluorescence microscopy
- phased array
- image stacks
- multiscale
- image segmentation
- phase unwrapping
- sar imagery
- real time
- sar imaging