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Measurement accuracy and repeatability in near-field scanning microwave microscopy.
Sijia Gu
Kamel Haddadi
Abdelhatif El Fellahi
Gilles Dambrine
Tuami Lasri
Published in:
I2MTC (2015)
Keyphrases
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high accuracy
image analysis
computational cost
classification accuracy
prediction accuracy
high resolution
error rate
artificial intelligence
information systems
measurement error
databases
image registration
high throughput
precision and recall
long range
improved accuracy