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Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique.
O. Benzaim
Kamel Haddadi
M. M. Wang
M. Maazi
David Glay
Tuami Lasri
Published in:
IEEE Trans. Instrum. Meas. (2008)
Keyphrases
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millimeter wave
computer vision
image processing
high quality
feature vectors
maximum likelihood
single image