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Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform.
Sijia Gu
Kamel Haddadi
Abdelhatif El Fellahi
Tuami Lasri
Published in:
IEEE Trans. Instrum. Meas. (2016)
Keyphrases
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bias variance
high accuracy
prediction accuracy
classification accuracy
image analysis
error rate
parameter settings
real time
computational efficiency
window size
root mean square error
feature space
image processing
expectation maximization
high precision
sensitivity analysis
structured light
neural network