Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications.

Hind Bakli Kamel Haddadi Tuami Lasri

Published in: IEEE Trans. Instrum. Meas. (2014)

Keyphrases

image analysis
long range
image reconstruction
high throughput
fourier transform
structured light
image processing
confocal images
high resolution
synthetic aperture radar
scan data
fluorescence microscopy
image stacks
database
waveguide
phased array