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Shizunori Matsumoto
Publication Activity (10 Years)
Years Active: 2001-2018
Publications (10 Years): 2
Top Topics
High Speed Networks
Image Processing And Analysis
Parallel Computers
Physical Design
Top Venues
Sensors
ISSCC
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Publications
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Atsushi Nose
,
Tomohiro Yamazaki
,
Hironobu Katayama
,
Shuji Uehara
,
Masatsugu Kobayashi
,
Sayaka Shida
,
Masaki Odahara
,
Kenichi Takamiya
,
Shizunori Matsumoto
,
Leo Miyashita
,
Yoshihiro Watanabe
,
Takashi Izawa
,
Yoshinori Muramatsu
,
Yoshikazu Nitta
,
Masatoshi Ishikawa
Design and Performance of a 1 ms High-Speed Vision Chip with 3D-Stacked 140 GOPS Column-Parallel PEs.
Sensors
18 (5) (2018)
Tomohiro Yamazaki
,
Hironobu Katayama
,
Shuji Uehara
,
Atsushi Nose
,
Masatsugu Kobayashi
,
Sayaka Shida
,
Masaki Odahara
,
Kenichi Takamiya
,
Yasuaki Hisamatsu
,
Shizunori Matsumoto
,
Leo Miyashita
,
Yoshihiro Watanabe
,
Takashi Izawa
,
Yoshinori Muramatsu
,
Masatoshi Ishikawa
4.9 A 1ms high-speed vision chip with 3D-stacked 140GOPS column-parallel PEs for spatio-temporal image processing.
ISSCC
(2017)
Shizunori Matsumoto
,
Hiroaki Ueno
,
Satoshi Hosokawa
,
Toshihiko Kitamura
,
Mitiko Miura-Mattausch
,
Hans Jürgen Mattausch
,
Tatsuya Ohguro
,
Shigetaka Kumashiro
,
Tetsuya Yamaguchi
,
Kyoji Yamashita
,
Noriaki Nakayama
-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation.
IEICE Trans. Electron.
(2) (2005)
D. Miyawaki
,
Shizunori Matsumoto
,
Hans Jürgen Mattausch
,
S. Ooshiro
,
Masami Suetake
,
Mitiko Miura-Mattausch
,
Shigetaka Kumashiro
,
Tetsuya Yamaguchi
,
Kyoji Yamashita
,
Noriaki Nakayama
Correlation method of circuit-performance and technology fluctuations for improved design reliability.
ASP-DAC
(2001)
Shizunori Matsumoto
,
Hans Jürgen Mattausch
,
S. Ooshiro
,
Y. Tatsumi
,
Mitiko Miura-Mattausch
,
Shigetaka Kumashiro
,
Terufumi Yamaguchi
,
Kyoji Yamashita
,
Noriaki Nakayama
Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability.
CICC
(2001)