Correlation method of circuit-performance and technology fluctuations for improved design reliability.
D. MiyawakiShizunori MatsumotoHans Jürgen MattauschS. OoshiroMasami SuetakeMitiko Miura-MattauschShigetaka KumashiroTetsuya YamaguchiKyoji YamashitaNoriaki NakayamaPublished in: ASP-DAC (2001)
Keyphrases
- improved algorithm
- significant improvement
- objective function
- preprocessing
- detection method
- synthetic data
- case study
- computational complexity
- correlation coefficient
- optimization algorithm
- segmentation method
- high precision
- circuit design
- cross correlation
- classification method
- mathematical model
- segmentation algorithm
- experimental evaluation
- cost function
- similarity measure