Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability.
Shizunori MatsumotoHans Jürgen MattauschS. OoshiroY. TatsumiMitiko Miura-MattauschShigetaka KumashiroTerufumi YamaguchiKyoji YamashitaNoriaki NakayamaPublished in: CICC (2001)
Keyphrases
- circuit design
- analog vlsi
- mixed signal
- sigma delta
- evolvable hardware
- cmos technology
- digital circuits
- analog circuits
- cmos image sensor
- high speed
- power dissipation
- neural network
- low power
- chip design
- single chip
- low cost
- functional verification
- analog to digital converter
- modular design
- micron cmos
- vlsi implementation
- physical design
- printed circuit boards
- design tools
- high density
- multi channel
- power consumption
- infrared
- user interface