Sang Jeen Hong

Publication Activity (10 Years)

Years Active: 2005-2023
Publications (10 Years): 1

Top Topics

Fault Detection

Chaotic Time Series

Hebbian Learning

Industrial Processes

Top Venues

J. Inf. Process. Syst.

Publications

Jeong Eun Choi, Da Hoon Seol, Chan Young Kim, Sang Jeen Hong
Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data. Sensors 23 (4) (2023)
Muhammad Zeeshan Arshad, Javeria Muhammad Nawaz, Sang Jeen Hong
Fault Detection in the Semiconductor Etch Process Using the Seasonal Autoregressive Integrated Moving Average Modeling. J. Inf. Process. Syst. 10 (3) (2014)
Javeria Muhammad Nawaz, Muhammad Zeeshan Arshad, Sang Jeen Hong
Time Series Fault Prediction in Semiconductor Equipment Using Recurrent Neural Network. ISNN (2) (2013)
Sung-Ik Jeon, Seung-Gyun Kim, Sang Jeen Hong, Seung Soo Han
Plasma Etching Using Expanded Hidden Markov Model. ISNN (2) (2010)
Hyun-Soo Kim, Sang Jeen Hong, Seung Soo Han
A comparison and analysis of genetic algorithm and particle swarm optimization using neural network models for high efficiency solar cell fabrication processes. FUZZ-IEEE (2009)
SungJoon Lee, A. Pandey, DongSeop Kim, A. Rohatgi, Gary S. May, Sang Jeen Hong, Seung Soo Han
Characterization and Optimization of the Contact Formation for High-Performance Silicon Solar Cells. ISNN (3) (2007)
Byungwhan Kim, Sooyoun Kim, Sang Jeen Hong
Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network. ISNN (2) (2006)
Seung Soo Han, Dong Sun Seo, Sang Jeen Hong
Modeling and Characterization of Plasma Processes Using Modular Neural Network. ISNN (2) (2006)
Dong-Chul Park, Duc-Hoai Nguyen, Sang Jeen Hong, Yunsik Lee
Equalization of a Wireless ATM Channel with Simplified Complex Bilinear Recurrent Neural Network. ICNC (1) (2005)
Sang Jeen Hong, Gary S. May
Neural-Network-Based Sensor Fusion of Optical Emission and Mass Spectroscopy Data for Real-Time Fault Detection in Reactive Ion Etching. IEEE Trans. Ind. Electron. 52 (4) (2005)
Sei-Young Mun, Gwang-Beom Kim, Dea-Wha Soh, Sang Jeen Hong
Characterization of Negative Photoresist Processing by Statistical Design of Experiment (DOE). J. Inform. and Commun. Convergence Engineering 3 (4) (2005)
SungJoon Lee, Dea-Wha Soh, Sang Jeen Hong
Sensitivity Analysis of Plasma Charge-up Monitoring Sensor. J. Inform. and Commun. Convergence Engineering 3 (4) (2005)