Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network.
Byungwhan KimSooyoun KimSang Jeen HongPublished in: ISNN (2) (2006)
Keyphrases
- x ray
- neural network
- fault diagnosis
- medical imaging
- pattern recognition
- x ray images
- intraoperative
- three dimensional
- electron microscopy
- wavelet transform
- ct scans
- digital x ray images
- feature extraction
- tomographic images
- denoising
- object recognition
- low dose
- multiscale
- projection images
- dual energy
- multiresolution
- multi layer
- transmission electron microscopy
- electron microscope