Byungwhan Kim

Publication Activity (10 Years)

Years Active: 2002-2013
Publications (10 Years): 0

Top Topics

Weighted Moving Average

Semiconductor Manufacturing

Top Venues

Comput. Electr. Eng.

Appl. Soft Comput.

Expert Syst. Appl.

Publications

Young-Seon Jeong, Byungwhan Kim, Young-Don Ko
Exponentially weighted moving average-based procedure with adaptive thresholding for monitoring nonlinear profiles: Monitoring of plasma etch process in semiconductor manufacturing. Expert Syst. Appl. 40 (14) (2013)
Dongil Han, Jongho Choi, Byungwhan Kim, Jae Il Cho
Design and VLSI implementation of a high-performance face detection engine. Comput. Electr. Eng. 38 (5) (2012)
Byungwhan Kim, Daehyun Kim
Use of neural network to in situ conditioning of semiconductor plasma processing equipment. Appl. Soft Comput. 12 (2) (2012)
Byungwhan Kim, Sanghee Kwon
Wavelet-coupled backpropagation neural network as a chamber leak detector of plasma processing equipment. Expert Syst. Appl. 38 (5) (2011)
Su Jin Lee, Byungwhan Kim, Sung Wook Baik
Neural network modeling of inter-characteristics of silicon nitride film deposited by using a plasma-enhanced chemical vapor deposition. Expert Syst. Appl. 38 (9) (2011)
Byungwhan Kim, Sanghee Kwon, Donghwan Kim
Optimization of optical lens-controlled scanning electron microscopic resolution using generalized regression neural network and genetic algorithm. Expert Syst. Appl. 37 (1) (2010)
Byungwhan Kim, Hee Ju Kwon, Seongjin Choi
Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties. Expert Syst. Appl. 36 (3) (2009)
Byungwhan Kim, Jeong Kim, Seongjin Choi
Use of neural network to model X-ray photoelectron spectroscopy data for diagnosis of plasma etch equipment. Expert Syst. Appl. 36 (8) (2009)
Byungwhan Kim, Hwajune Lee, Donghwan Kim
Modeling of Thin Film Process Data Using a Genetic Algorithm-Optimized Initial Weight of Backpropagation Neural Network. Appl. Artif. Intell. 23 (2) (2009)
Byungwhan Kim, Seongjin Choi
Adaptive Network-Based Fuzzy Inference Model of Plasma Enhanced Chemical Vapor Deposition Process. ISNN (1) (2007)
Byungwhan Kim, Donghwan Kim, Seung Soo Han
Prediction of Radio Frequency Impedance Matching in Plasma Equipment Using Neural Network. ISNN (2) (2006)
Byungwhan Kim, Jae Young Park, Donghwan Kim, Seung Soo Han
Diagnosis Model of Radio Frequency Impedance Matching in Plasma Equipment by Using Neural Network and Wavelets. PRICAI (2006)
Byungwhan Kim, Wooram Ko, Seung Soo Han
Neural Network Recognition of Scanning Electron Microscope Image for Plasma Diagnosis. PRICAI (2006)
Byungwhan Kim, Sooyoun Kim, Sang Jeen Hong
Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network. ISNN (2) (2006)
Byungwhan Kim, Dukwoo Lee, Seung Soo Han
Prediction of Plasma Enhanced Deposition Process Using GA-Optimized GRNN. ISNN (2) (2006)
Byungwhan Kim, Jang Hyun Park, Beom-Soo Kim
Fuzzy Logic Model of Langmuir Probe Discharge Data. Comput. Chem. 26 (6) (2002)