EYE DETECTION
Experts
- Qiang Ji
- Stan Z. Li
- Wen Gao
- Anil K. Jain
- Xilin Chen
- Zhen Lei
- Rama Chellappa
- Andreas Bulling
- Zhiwei Zhu
- Modesto Castrillón Santana
- Vishal M. Patel
- Hazem M. El-Bakry
- Daijin Kim
- Chengjun Liu
- Stefanos Zafeiriou
- Junjie Yan
- Xiaoou Tang
- Myron Flickner
- Thomas S. Huang
- Shiguang Shan
- Jiankang Deng
- Weihong Deng
- Brian C. Lovell
- Jean-Luc Dugelay
- Marios Savvides
- Ran He
- Harry Wechsler
- Shuo Yang
- Jeffrey F. Cohn
- Mayank Vatsa
- Jeff B. Pelz
- Takashi Nagamatsu
- Richa Singh
- Chen Change Loy
- Yusuke Sugano
- Shuo Chen
- Pavel Král
- Javier Lorenzo-Navarro
- Chih-Peng Fan
Venues
- CoRR
- ICIP
- Pattern Recognit.
- FG
- ETRA
- Multim. Tools Appl.
- ICPR
- Sensors
- ICME
- Pattern Recognit. Lett.
- CVPR
- SMC
- CVPR Workshops
- NeuroImage
- IJCNN
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Vis. Image Underst.
- IEEE Access
- CHI Extended Abstracts
- Image Vis. Comput.
- ICASSP
- WACV
- VR
- IROS
- Int. J. Pattern Recognit. Artif. Intell.
- ICIP (1)
- AVBPA
- ICCV
- SIU
- MVA
- Neurocomputing
- ROBIO
- CCBR
- IEICE Trans. Inf. Syst.
- EMBC
- IEEE Signal Process. Lett.
- RO-MAN
- EUSIPCO
- IEEE Trans. Image Process.
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