Login / Signup
Characterization of Negative Photoresist Processing by Statistical Design of Experiment (DOE).
Sei-Young Mun
Gwang-Beom Kim
Dea-Wha Soh
Sang Jeen Hong
Published in:
J. Inform. and Commun. Convergence Engineering (2005)
Keyphrases
</>
real time
design process
machine learning
databases
optimal design
case study
neural network
feature selection
image processing
data mining
object oriented
high speed
data driven
real world
positive and negative
user experience
integrated circuit
design methodology