Ryutaro Yasuhara

Publication Activity (10 Years)

Years Active: 2013-2020
Publications (10 Years): 7

Top Topics

Intelligent Behavior

Ai Technologies

Highly Reliable

Top Venues

Publications

Ryutaro Yasuhara
TaOx ReRAM as a Highly-Reliable Embedded Memory and Its Application to Edge AI. VLSI-DAT (2020)
Ryutaro Yasuhara, Takashi Ono, Reiji Mochida, Shunsaku Muraoka, Kazuyuki Kouno, Koji Katayama, Yuriko Hayata, Masayoshi Nakayama, Hitoshi Suwa, Yukio Hayakawa, Takumi Mikawa, Yasushi Gohou, Shinichi Yoneda
Reliability Issues in Analog ReRAM Based Neural-Network Processor. IRPS (2019)
Shouhei Fukuyama, Atsuna Hayakawa, Ryutaro Yasuhara, Shinpei Matsuda, Hiroshi Kinoshita, Ken Takeuchi
Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM. IRPS (2019)
Kazuki Maeda, Shinpei Matsuda, Ken Takeuchi, Ryutaro Yasuhara
Observation and Analysis of Bit-by-Bit Cell Current Variation During Data-Retention of TaOx-based ReRAM. ESSDERC (2018)
Shouhei Fukuyama, Shinpei Matsuda, Ryutaro Yasuhara, Ken Takeuchi
Improvement of Endurance and Data-retention in 40nm TaOX-based ReRAM by Finalize Verify. NVMTS (2018)
Shouhei Fukuyama, Kazuki Maeda, Shinpei Matsuda, Ken Takeuchi, Ryutaro Yasuhara
Suppression of endurance-stressed data-retention failures of 40nm TaOx-based ReRAM. IRPS (2018)
Takashi Inose, Seiichi Aritome, Ryutaro Yasuhara, Satoshi Mishima, Ken Takeuchi
Study of error repeatability and recovery in 40nm TaOx ReRAM. ESSDERC (2017)
Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, W. Boullart, E. Vecchio, T. Vandeweyer, T. Witters, D. Crotti, M. Jurczak, S. Fujii, S. Ito, Y. Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda
Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application. VLSIC (2015)
Zhiqiang Wei, Koji Katayama, Shunsaku Muraoka, Ryutaro Yasuhara, Takumi Mikawa, Koji Eriguchi
A new prediction method for ReRAM data retention statistics based on 3D filament structures. IRPS (2015)
Zhiqiang Wei, Ryutaro Yasuhara, Koji Katayama, Takumi Mikawa, Takeki Ninomiya, Shunsaku Muraoka
Quantitative method for estimating characteristics of conductive filament in ReRAM. ISCAS (2014)
Ken Kawai, Akifumi Kawahara, Ryutaro Yasuhara, Shunsaku Muraoka, Zhiqiang Wei, Ryotaro Azuma, Kouhei Tanabe, Kazuhiko Shimakawa
Highly-reliable TaOx reram technology using automatic forming circuit. ICICDT (2014)
Akifumi Kawahara, Ken Kawai, Yuuichirou Ikeda, Yoshikazu Katoh, Ryotaro Azuma, Yuhei Yoshimoto, Kouhei Tanabe, Zhiqiang Wei, Takeki Ninomiya, Koji Katayama, Ryutaro Yasuhara, Shunsaku Muraoka, Atsushi Himeno, Naoki Yoshikawa, Hideaki Murase, Kazuhiko Shimakawa, Takeshi Takagi, Takumi Mikawa, Kunitoshi Aono
Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM. ISSCC (2013)