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Highly reliable TaOx ReRAM with centralized filament for 28-nm embedded application.

Yukio HayakawaAtsushi HimenoRyutaro YasuharaW. BoullartE. VecchioT. VandeweyerT. WittersD. CrottiM. JurczakS. FujiiS. ItoY. KawashimaYuuichirou IkedaAkifumi KawaharaKen KawaiZhiqiang WeiShunsaku MuraokaKazuhiko ShimakawaTakumi MikawaShinichi Yoneda
Published in: VLSIC (2015)
Keyphrases
  • highly reliable
  • database
  • real time
  • neural network
  • genetic algorithm
  • search engine
  • image sequences
  • artificial neural networks
  • low cost
  • distributed environment
  • application specific