Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM.
Shouhei FukuyamaAtsuna HayakawaRyutaro YasuharaShinpei MatsudaHiroshi KinoshitaKen TakeuchiPublished in: IRPS (2019)
Keyphrases
- trade off
- data sets
- comprehensive analysis
- raw data
- training data
- data collection
- high quality
- knowledge discovery
- data analysis
- data points
- synthetic data
- image data
- small number
- input data
- original data
- statistical analysis
- data acquisition
- database
- data quality
- statistical methods
- multimedia data
- experimental data
- application domains
- missing data
- information systems
- data processing
- prior knowledge
- neural network