Improvement of Endurance and Data-retention in 40nm TaOX-based ReRAM by Finalize Verify.
Shouhei FukuyamaShinpei MatsudaRyutaro YasuharaKen TakeuchiPublished in: NVMTS (2018)
Keyphrases
- data sets
- data collection
- raw data
- database
- data quality
- high quality
- synthetic data
- end users
- data sources
- image data
- application domains
- long term
- probability distribution
- prior knowledge
- small number
- data processing
- data analysis
- statistical analysis
- video sequences
- data mining algorithms
- training data
- data distribution
- network structure
- multimedia data
- knowledge base
- learning algorithm
- complex data