Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM.
Akifumi KawaharaKen KawaiYuuichirou IkedaYoshikazu KatohRyotaro AzumaYuhei YoshimotoKouhei TanabeZhiqiang WeiTakeki NinomiyaKoji KatayamaRyutaro YasuharaShunsaku MuraokaAtsushi HimenoNaoki YoshikawaHideaki MuraseKazuhiko ShimakawaTakeshi TakagiTakumi MikawaKunitoshi AonoPublished in: ISSCC (2013)