Study of error repeatability and recovery in 40nm TaOx ReRAM.

Takashi Inose Seiichi Aritome Ryutaro Yasuhara Satoshi Mishima Ken Takeuchi

Published in: ESSDERC (2017)

Keyphrases

empirical studies
neural network
error analysis
databases
learning algorithm
artificial intelligence
information systems
similarity measure
expert systems
simulation study
prediction error
feature detection