Observation and Analysis of Bit-by-Bit Cell Current Variation During Data-Retention of TaOx-based ReRAM.
Kazuki MaedaShinpei MatsudaKen TakeuchiRyutaro YasuharaPublished in: ESSDERC (2018)
Keyphrases
- data analysis
- data sets
- statistical analysis
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- synthetic data
- data quality
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- high quality
- quantitative data
- data objects
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- machine learning
- long term
- sensor data
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- prior knowledge
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- high dimensional
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- correlation analysis