Ronald J. W. T. Tangelder

Publication Activity (10 Years)

Years Active: 1996-2002
Publications (10 Years): 0

Publications

V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures. J. Electron. Test. 18 (2) (2002)
V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
An implementation for test-time reduction in VLIW transport-triggered architectures. ETW (2001)
David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
Modeling a Verification Test System for Mixed-Signal Circuits. IEEE Des. Test Comput. 18 (1) (2001)
V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
Design and Test Space Exploration of Transport-Triggered Architectures. DATE (2000)
V. A. Zivkovic, Ronald J. W. T. Tangelder, H. G. Herkhoff
The Test-Cycle Minimization in Parameterized Bus-Oriented Datapath Designs. LATW (2000)
Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek
Integrated Design and Test of Mixed-Signal Circuits. J. Electron. Test. 14 (1-2) (1999)
Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. J. Electron. Test. 14 (1-2) (1999)
Richard Rosing, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Manoj Sachdev
Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters. J. Electron. Test. 14 (1-2) (1999)
R. H. Beurze, Y. Xing, R. van Kleef, Ronald J. W. T. Tangelder, Nur Engin
Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier. ETW (1999)
Ronald J. W. T. Tangelder, G. Diemel, Hans G. Kerkhoff
Smart sensor system application: an integrated compass. ED&TC (1997)
Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek, Nur Engin
MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation. ICECS (1996)