Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters.
Richard RosingHans G. KerkhoffRonald J. W. T. TangelderManoj SachdevPublished in: J. Electron. Test. (1999)
Keyphrases
- mixed signal
- circuit design
- low power
- cmos image sensor
- analog vlsi
- multi channel
- digital circuits
- high speed
- low cost
- single chip
- power consumption
- solid state
- imaging systems
- sigma delta
- model based diagnosis
- dynamic range
- analog to digital converter
- focal plane
- phase locked loop
- fault diagnosis
- high resolution
- image sensor
- model based reasoning
- data conversion
- delta sigma
- neural network
- medical diagnosis
- programmable logic
- cmos technology
- printed circuit
- packet loss
- expert systems