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Practical implementation of defect-oriented testing for a mixed-signal class-D amplifier.

R. H. BeurzeY. XingR. van KleefRonald J. W. T. TangelderNur Engin
Published in: ETW (1999)
Keyphrases
  • vlsi circuits
  • efficient implementation
  • mixed signal
  • image processing
  • case study
  • low power