Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.
Chris FeigeJan Ten PierickClemens WoutersRonald J. W. T. TangelderHans G. KerkhoffPublished in: J. Electron. Test. (1999)
Keyphrases
- test data
- significant improvement
- main contribution
- experimental evaluation
- synthetic data
- similarity measure
- detection method
- high precision
- cost function
- high accuracy
- bayesian networks
- optimization method
- statistical tests
- segmentation method
- denoising
- binary images
- error rate
- statistical significance
- theoretical analysis
- model selection
- decision trees
- support vector machine
- computational cost
- evolutionary algorithm
- feature space
- preprocessing
- objective function
- training data
- image segmentation