Robert E. Geer

Publication Activity (10 Years)

Years Active: 2007-2019
Publications (10 Years): 2

Top Topics

Field Effect Transistors

Fault Localization

Silicon Dioxide

Design Parameters

Top Venues

J. Electron. Test.

Microelectron. J.

Publications

Robert Carroll, Robert E. Geer
Fault localization in a 3D test assembly using voltage contrast imaging. Microelectron. J. 87 (2019)
Harika Manem, Karsten Beckmann, Min Xu, Robert Carroll, Robert E. Geer, Nathaniel C. Cady
An extendable multi-purpose 3D neuromorphic fabric using nanoscale memristors. CISDA (2015)
Benjamin Backes, Colin McDonough, Larry Smith, Wei Wang, Robert E. Geer
Effects of Copper Plasticity on the Induction of Stress in Silicon from Copper Through-Silicon Vias (TSVs) for 3D Integrated Circuits. J. Electron. Test. 28 (1) (2012)
Robert E. Geer
Plenary speaker: Connectivity driven systems: On-chip, off-chip and in-between. SoCC (2012)
Narender Rana, Christopher Kossow, Eric T. Eisenbraun, Robert E. Geer, Alain E. Kaloyeros
Controlling Interfacial Adhesion of Self-Assembled Polypeptide Fibrils for Novel Nanoelectromechanical System (NEMS) Applications. Micromachines 2 (1) (2011)
Le Yu, Haigang Yang, Tom T. Jing, Min Xu, Robert E. Geer, Wei Wang
Electrical characterization of RF TSV for 3D multi-core and heterogeneous ICs. ICCAD (2010)
Sansiri Tanachutiwat, Shuhong Liu, Robert E. Geer, Wei Wang
Monolithic Graphene Nanoribbon Electronics for Interconnect Performance Improvement. ISCAS (2009)
Alain E. Kaloyeros, Mircea R. Stan, Barry Arkles, Robert E. Geer, Eric T. Eisenbraun, James E. Raynolds, Anand Gadre, Yongqiang Xue, James Ryan
Conformational Molecular Switches for Post-CMOS Nanoelectronics. IEEE Trans. Circuits Syst. I Regul. Pap. (11) (2007)