Benjamin Backes

Publication Activity (10 Years)

Years Active: 2012-2012
Publications (10 Years): 0

Top Topics

Integrated Circuit

Silicon Dioxide

Top Venues

J. Electron. Test.

Publications

Benjamin Backes, Colin McDonough, Larry Smith, Wei Wang, Robert E. Geer
Effects of Copper Plasticity on the Induction of Stress in Silicon from Copper Through-Silicon Vias (TSVs) for 3D Integrated Circuits. J. Electron. Test. 28 (1) (2012)