Richard Lallemand

Publication Activity (10 Years)

Years Active: 2001-2017
Publications (10 Years): 2

Top Topics

High Temperature

Top Venues

Microelectron. Reliab.

Publications

Philippe Pougnet, Gerard Coquery, Richard Lallemand, A. Makhloufi
Power module thermal cycling tester for in-situ ageing detection. Microelectron. Reliab. (2017)
Ali Ibrahim, Jean-Pierre Ousten, Richard Lallemand, Zoubir Khatir
Power cycling issues and challenges of SiC-MOSFET power modules in high temperature conditions. Microelectron. Reliab. 58 (2016)
Mohamed Ayadi, Olivier Briat, Richard Lallemand, Gerard Coquery, Jean-Michel Vinassa
Influence of thermal cycling on supercapacitor performance fading during ageing test at constant voltage. ISIE (2014)
Mohamed Ayadi, Olivier Briat, Richard Lallemand, Akram Eddahech, Ronan German, Gerard Coquery, Jean-Michel Vinassa
Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test. Microelectron. Reliab. 54 (9-10) (2014)
L. Dupont, J. L. Blanchard, Richard Lallemand, Gerard Coquery, Jean-Michel Morelle, G. Blondel, B. Rouleau
Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode. Microelectron. Reliab. 50 (9-11) (2010)
A. Hammar, Pascal Venet, Richard Lallemand, Gerard Coquery, Gérard Rojat
Study of Accelerated Aging of Supercapacitors for Transport Applications. IEEE Trans. Ind. Electron. 57 (12) (2010)
Gerard Coquery, Guy Lefranc, T. Licht, Richard Lallemand, Norbert Seliger, H. Berg
High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC. Microelectron. Reliab. 43 (9-11) (2003)
Gerard Coquery, S. Carubelli, Jean-Pierre Ousten, Richard Lallemand, Frederic Lecoq, Dominique Lhotellier, V. de Viry, Philippe Dupuy
Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter. Microelectron. Reliab. 41 (9-10) (2001)