L. Dupont

Publication Activity (10 Years)

Years Active: 2006-2014
Publications (10 Years): 0

Top Topics

High Temperature

Environmental Conditions

Top Venues

Microelectron. Reliab.

Publications

Son-Ha Tran, L. Dupont, Zoubir Khatir
Solder void position and size effects on electro thermal behaviour of MOSFET transistors in forward bias conditions. Microelectron. Reliab. 54 (9-10) (2014)
Y. Celnikier, L. Dupont, E. Hervé, Gerard Coquery, Lahouari Benabou
Optimization of wire connections design for power electronics. Microelectron. Reliab. 51 (9-11) (2011)
Y. Celnikier, Lahouari Benabou, L. Dupont, Gerard Coquery
Investigation of the heel crack mechanism in Al connections for power electronics modules. Microelectron. Reliab. 51 (5) (2011)
L. Dupont, J. L. Blanchard, Richard Lallemand, Gerard Coquery, Jean-Michel Morelle, G. Blondel, B. Rouleau
Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode. Microelectron. Reliab. 50 (9-11) (2010)
Zoubir Khatir, L. Dupont, Ali Ibrahim
Investigations on junction temperature estimation based on junction voltage measurements. Microelectron. Reliab. 50 (9-11) (2010)
L. Dupont, Gerard Coquery, K. Kriegel, A. Melkonyan
Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application. Microelectron. Reliab. 49 (9-11) (2009)
L. Dupont, Stéphane Lefebvre, M. Bouaroudj, Zoubir Khatir, Jean-Claude Faugières
Failure modes on low voltage power MOSFETs under high temperature application. Microelectron. Reliab. 47 (9-11) (2007)
M. Bouarroudj, Zoubir Khatir, Jean-Pierre Ousten, F. Badel, L. Dupont, Stéphane Lefebvre
Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditions. Microelectron. Reliab. 47 (9-11) (2007)
L. Dupont, Zoubir Khatir, Stéphane Lefebvre, S. Bontemps
Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling. Microelectron. Reliab. 46 (9-11) (2006)