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Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application.
L. Dupont
Gerard Coquery
K. Kriegel
A. Melkonyan
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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high temperature
computer systems
data processing
key technologies
data mining
information systems
expert systems
information technology
mobile devices
decision support
power consumption
precision agriculture