Gerard Coquery

Publication Activity (10 Years)

Years Active: 2001-2017
Publications (10 Years): 1

Top Topics

Design Methodologies

Electric Vehicles

Physical Constraints

Top Venues

Microelectron. Reliab.

IEEE Trans. Veh. Technol.

Publications

Philippe Pougnet, Gerard Coquery, Richard Lallemand, A. Makhloufi
Power module thermal cycling tester for in-situ ageing detection. Microelectron. Reliab. (2017)
Mohamed Ayadi, Olivier Briat, Richard Lallemand, Gerard Coquery, Jean-Michel Vinassa
Influence of thermal cycling on supercapacitor performance fading during ageing test at constant voltage. ISIE (2014)
Mahraz Bendali, Chérif Larouci, Toufik Azib, Claude Marchand, Gerard Coquery
Reliability assesment in the design of interleaved converters under multi-physical constraints. ISIE (2014)
Mohamed Ayadi, Olivier Briat, Richard Lallemand, Akram Eddahech, Ronan German, Gerard Coquery, Jean-Michel Vinassa
Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test. Microelectron. Reliab. 54 (9-10) (2014)
Mahraz Bendali, Chérif Larouci, Toufik Azib, Claude Marchand, Gerard Coquery
Design methodology with optimization of an interleaved buck converter for automotive application. EUROCON (2013)
Mohamed Ayadi, Olivier Briat, Akram Eddahech, Ronan German, Gerard Coquery, Jean-Michel Vinassa
Thermal cycling impacts on supercapacitor performances during calendar ageing. Microelectron. Reliab. 53 (9-11) (2013)
Abdelfatah Kolli, Olivier Bethoux, Alexandre De Bernardinis, Eric Labouré, Gerard Coquery
Space-Vector PWM Control Synthesis for an H-Bridge Drive in Electric Vehicles. IEEE Trans. Veh. Technol. 62 (6) (2013)
Y. Celnikier, L. Dupont, E. Hervé, Gerard Coquery, Lahouari Benabou
Optimization of wire connections design for power electronics. Microelectron. Reliab. 51 (9-11) (2011)
Y. Celnikier, Lahouari Benabou, L. Dupont, Gerard Coquery
Investigation of the heel crack mechanism in Al connections for power electronics modules. Microelectron. Reliab. 51 (5) (2011)
L. Dupont, J. L. Blanchard, Richard Lallemand, Gerard Coquery, Jean-Michel Morelle, G. Blondel, B. Rouleau
Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode. Microelectron. Reliab. 50 (9-11) (2010)
A. Hammar, Pascal Venet, Richard Lallemand, Gerard Coquery, Gérard Rojat
Study of Accelerated Aging of Supercapacitors for Transport Applications. IEEE Trans. Ind. Electron. 57 (12) (2010)
L. Dupont, Gerard Coquery, K. Kriegel, A. Melkonyan
Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application. Microelectron. Reliab. 49 (9-11) (2009)
Gerard Coquery, Guy Lefranc, T. Licht, Richard Lallemand, Norbert Seliger, H. Berg
High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC. Microelectron. Reliab. 43 (9-11) (2003)
Gerard Coquery, S. Carubelli, Jean-Pierre Ousten, Richard Lallemand, Frederic Lecoq, Dominique Lhotellier, V. de Viry, Philippe Dupuy
Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter. Microelectron. Reliab. 41 (9-10) (2001)