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Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test.

Mohamed AyadiOlivier BriatRichard LallemandAkram EddahechRonan GermanGerard CoqueryJean-Michel Vinassa
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • high level
  • electrical properties
  • infrared
  • test data
  • evolutionary algorithm
  • test cases
  • finite element analysis
  • simplex method
  • thermal images