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Failure modes on low voltage power MOSFETs under high temperature application.
L. Dupont
Stéphane Lefebvre
M. Bouaroudj
Zoubir Khatir
Jean-Claude Faugières
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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low voltage
failure modes
high temperature
design considerations
image processing
hidden markov models
power consumption
power line