Peter Jacob

Publication Activity (10 Years)

Years Active: 2004-2021
Publications (10 Years): 5

Top Topics

Manufacturing Industry

Failure Prediction

Randomly Selected

Top Venues

Microelectron. Reliab.

Comput. Methods Programs Biomed.

Publications

Zeinab Mahmoudi, Simone Del Favero, Peter Jacob, Pratik Choudhary, Hypo-RESOLVE Consortium
Toward an Optimal Definition of Hypoglycemia with Continuous Glucose Monitoring. Comput. Methods Programs Biomed. 209 (2021)
Peter Jacob, Roman Furrer
A very unusual transistor failure, caused by a solenoid. Microelectron. Reliab. (2017)
Peter Jacob, Uwe Thiemann
New ESD challenges in RFID manufacturing. Microelectron. Reliab. (2017)
Peter Jacob
Failure mechanisms and precautions in plug connectors and relays. Microelectron. Reliab. 64 (2016)
Peter Jacob
Early life field failures in modern automotive electronics - An overview; root causes and precautions. Microelectron. Reliab. 64 (2016)
Peter Jacob
Unusual defects, generated by wafer sawing: An update, including pick&place processing. Microelectron. Reliab. 55 (9-10) (2015)
Peter Jacob
Failure analysis and reliability on system level. Microelectron. Reliab. 55 (9-10) (2015)
Peter Jacob, Giovanni Nicoletti
Failure causes generating aluminium protrusion/extrusion. Microelectron. Reliab. 53 (9-11) (2013)
Peter Jacob
From component to system failure analysis - The future challenge within work-sharing supply chains. Microelectron. Reliab. 51 (9-11) (2011)
Jochen Schuld, Thilo Schäfer, Stefan Nickel, Peter Jacob, Martin K. Schilling, Sven Richter
Impact of IT-supported clinical pathways on medical staff satisfaction. A prospective longitudinal cohort study. Int. J. Medical Informatics 80 (3) (2011)
Peter Jacob, Willy Knecht, Albert Kunz, Giovanni Nicoletti, Thomas Lautenschlager, Moreno Mondada, Damien Pachoud
Reading distance degradation mechanisms of near-field RFID devices. Microelectron. Reliab. 49 (9-11) (2009)
Peter Jacob
Surface ESD (ESDFOS) in assembly fab machineries as a functional and reliability risk - Failure analysis, tool diagnosis and on-site-remedies. Microelectron. Reliab. 48 (8-9) (2008)
Peter Jacob, Werner Rothkirch
Unusual defects, generated by wafer sawing: Diagnosis, mechanisms and how to distinguish from related failures. Microelectron. Reliab. 48 (8-9) (2008)
Peter Jacob, Giovanni Nicoletti, Florian Hauf
Device decapsulated (and/or depassivated) - Retest ok - What happened? Microelectron. Reliab. 47 (9-11) (2007)
Peter Jacob, Albert Kunz, Giovanni Nicoletti
Reliability and wearout characterisation of LEDs. Microelectron. Reliab. 46 (9-11) (2006)
Peter Jacob, Uwe Thiemann, Joachim C. Reiner
Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing. Microelectron. Reliab. 45 (7-8) (2005)
Peter Jacob, Joachim C. Reiner
Electrostatic Effects on Semiconductor Tools. Microelectron. Reliab. 44 (9-11) (2004)