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Unusual defects, generated by wafer sawing: Diagnosis, mechanisms and how to distinguish from related failures.

Peter JacobWerner Rothkirch
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • fault diagnosis
  • closely related
  • medical diagnosis
  • root cause
  • failure diagnosis
  • integrated circuit
  • databases
  • genetic algorithm
  • decision making
  • building blocks
  • massively parallel