Giovanni Nicoletti

Publication Activity (10 Years)

Years Active: 2006-2013
Publications (10 Years): 0

Top Topics

Failure Prediction

Top Venues

Microelectron. Reliab.

Publications

Peter Jacob, Giovanni Nicoletti
Failure causes generating aluminium protrusion/extrusion. Microelectron. Reliab. 53 (9-11) (2013)
Peter Jacob, Willy Knecht, Albert Kunz, Giovanni Nicoletti, Thomas Lautenschlager, Moreno Mondada, Damien Pachoud
Reading distance degradation mechanisms of near-field RFID devices. Microelectron. Reliab. 49 (9-11) (2009)
Peter Jacob, Giovanni Nicoletti, Florian Hauf
Device decapsulated (and/or depassivated) - Retest ok - What happened? Microelectron. Reliab. 47 (9-11) (2007)
Peter Jacob, Albert Kunz, Giovanni Nicoletti
Reliability and wearout characterisation of LEDs. Microelectron. Reliab. 46 (9-11) (2006)