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Reading distance degradation mechanisms of near-field RFID devices.
Peter Jacob
Willy Knecht
Albert Kunz
Giovanni Nicoletti
Thomas Lautenschlager
Moreno Mondada
Damien Pachoud
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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rfid tags
distance measure
low cost
mobile devices
rfid reader
supply chain
distance function
mechanism design
euclidean distance
cost effective
long range
distance measurement
data sets
learning algorithm
distance metric
personal computer