Joachim C. Reiner

Publication Activity (10 Years)

Years Active: 2001-2005
Publications (10 Years): 0

Publications

Peter Jacob, Uwe Thiemann, Joachim C. Reiner
Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing. Microelectron. Reliab. 45 (7-8) (2005)
Joachim C. Reiner, Philipp Nellen, Urs Sennhauser
Gallium Artefacts on FIB-milled Silicon Samples. Microelectron. Reliab. 44 (9-11) (2004)
Peter Jacob, Joachim C. Reiner
Electrostatic Effects on Semiconductor Tools. Microelectron. Reliab. 44 (9-11) (2004)
Joachim C. Reiner
Pre-breakdown leakage current fluctuations of thin gate oxide. Microelectron. Reliab. 43 (9-11) (2003)
Joachim C. Reiner, Philippe Gasser, Urs Sennhauser
Novel FIB-based sample preparation technique for TEM analysis of ultra-thin gate oxide breakdown. Microelectron. Reliab. 42 (9-11) (2002)
Joachim C. Reiner, Thomas Keller
Relevance of contact reliability in HBM-ESD test equipment. Microelectron. Reliab. 41 (9-10) (2001)