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Early life field failures in modern automotive electronics - An overview; root causes and precautions.

Peter Jacob
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • root cause
  • root cause analysis
  • electrical engineering
  • risk management
  • future trends
  • data sets
  • data mining
  • artificial intelligence
  • database
  • image processing
  • computational intelligence