Paul Kurpas

Publication Activity (10 Years)

Years Active: 2001-2014
Publications (10 Years): 0

Top Topics

Field Effect Transistors

Schottky Barrier

Gate Dielectrics

Top Venues

Microelectron. Reliab.

Publications

Sergey A. Chevtchenko, Matthias Schulz, Eldad Bahat-Treidel, Wilfred John, Stephan Freyer, Paul Kurpas, Joachim Würfl
Effect of gate trench fabrication technology on reliability of AlGaN/GaN heterojunction field effect transistors. Microelectron. Reliab. 54 (9-10) (2014)
Joachim Würfl, Eldad Bahat-Treidel, Frank Brunner, E. Cho, Oliver Hilt, Ponky Ivo, A. Knauer, Paul Kurpas, Richard Lossy, Matthias Schulz, S. Singwald, Markus Weyers, Rimma Zhytnytska
Reliability issues of GaN based high voltage power devices. Microelectron. Reliab. 51 (9-11) (2011)
Frank Brunner, A. Braun, Paul Kurpas, J. Schneider, Joachim Würfl, Markus Weyers
Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE. Microelectron. Reliab. 43 (6) (2003)
Joachim Würfl, Paul Kurpas, Frank Brunner, Michael Mai, Matthias Rudolph, Markus Weyers
Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing. Microelectron. Reliab. 41 (8) (2001)