Reliability issues of GaN based high voltage power devices.
Joachim WürflEldad Bahat-TreidelFrank BrunnerE. ChoOliver HiltPonky IvoA. KnauerPaul KurpasRichard LossyMatthias SchulzS. SingwaldMarkus WeyersRimma ZhytnytskaPublished in: Microelectron. Reliab. (2011)