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Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined temperature and current stressing.

Joachim WürflPaul KurpasFrank BrunnerMichael MaiMatthias RudolphMarkus Weyers
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • room temperature
  • desirable properties
  • neural network
  • databases
  • machine learning
  • genetic algorithm
  • decision trees