Lihua Dai

Publication Activity (10 Years)

Years Active: 2016-2024
Publications (10 Years): 11

Top Topics

Cmos Technology

Top Venues

Microelectron. Reliab.

IEICE Electron. Express

Comput. Appl. Math.

Publications

Lihua Dai, Ben Wang, Xuemin Cheng, Qin Wang, Xinsen Ni
The application of deep learning technology in integrated circuit design. Energy Inform. 7 (1) (2024)
Jin Gao, Lihua Dai
Anti-Periodic Synchronization of Clifford-Valued Neutral-Type Recurrent Neural Networks With D Operator. IEEE Access 10 (2022)
Jin Gao, Lihua Dai
Anti-periodic solutions of Clifford-valued fuzzy cellular neural networks with delays. Comput. Appl. Math. 41 (8) (2022)
Lihua Dai, Qingqing Shi
Intelligent Grasping Method of Multi-joint Manipulator Based on Deep Learning. ICISCAE (IEEE) (2021)
Yuanyuan Hou, Lihua Dai
S-Asymptotically ω-Periodic Solutions of Fractional-Order Complex-Valued Recurrent Neural Networks With Delays. IEEE Access 9 (2021)
Xiaonian Liu, Lihua Dai, Pingliang Li, Shichang Zou
Electrical performance of 130 nm PD-SOI MOSFET with diamond layout. Microelectron. J. 99 (2020)
Dianpeng Lin, Yiran Xu, Xiaonian Liu, Wenyi Zhu, Lihua Dai, Mengying Zhang, Xiaoyun Li, Xin Xie, Jianwei Jiang, Huilong Zhu, Zhengxuan Zhang, Shichang Zou
A novel highly reliable and low-power radiation hardened SRAM bit-cell design. IEICE Electron. Express 15 (3) (2018)
Zhiyuan Hu, Lihua Dai, Zhengxuan Zhang, Xiaoyun Li, Shichang Zou
Total dose radiation induced changes of the floating body effects in the partially depleted SOI NMOS with ultrathin gate oxide. IEICE Electron. Express 15 (4) (2018)
Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou
Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs. Microelectron. Reliab. 74 (2017)
Lei Song, Zhiyuan Hu, Mengying Zhang, Xiaonian Liu, Lihua Dai, Zhengxuan Zhang, Shichang Zou
Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology. Microelectron. Reliab. 74 (2017)
Shuang Fan, Bingxu Ning, Zhiyuan Hu, Zhengxuan Zhang, Dawei Bi, Chao Peng, Lei Song, Lihua Dai
Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs. Microelectron. Reliab. 56 (2016)