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Bias dependence of TID induced single transistor latch for 0.13 μm partially depleted SOI input/output NMOSFETs.
Shuang Fan
Bingxu Ning
Zhiyuan Hu
Zhengxuan Zhang
Dawei Bi
Chao Peng
Lei Song
Lihua Dai
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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input output
low power
high speed
fuzzy neural network
internal states
fuzzy model
fuzzy modeling
data envelopment analysis
noise cancellation
state transition
power consumption
fuzzy controller
integrated circuit
low cost
nonlinear functions
fuzzy inference system
fuzzy logic controller