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Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs.

Lihua DaiXiaonian LiuMengying ZhangLeqing ZhangZhiyuan HuDawei BiZhengxuan ZhangShichang Zou
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • x ray
  • infrared
  • multi channel
  • database
  • neural network
  • cellular networks
  • databases
  • learning algorithm
  • wireless channels
  • transmission electron microscopy